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Issue DateTitle / Author(s) / CitationFileAltmetrics
2017-03

Oh, Eunho; Byun, Junghwan; Lee, Byeongmoon; Kim, Sangwoo; Kim, Daesik; Yoon, Jaeyoung; Hong, Yongtaek

Advanced Electronic Materials, Vol.3 No.3, p. 1600517

DOI
1