Design and Fabrication of Highly Stable Oxide TFT Shift-Register Employing the Current Sensing Feedback System

Abstract

Integration of shift registers on the glass panel allows the display to be thinner, lighter, and cheaper to produce, thanks to the reduction of the number of ICs for scanning horizontal lines. Circuits of the shift register employing n-type thin film transistors (TFTs), such as hydrogenated amorphous silicon (a-Si:H) and oxide TFTs, have been reported. Recently, oxide TFTs attract much attention due to their high mobility (5~10 cm2/V∙s) compared with that of a-Si:H TFT (0.8cm2/V∙s). However, oxide TFTs often suffer from severe degradation of the threshold voltage (VTH) against the temperature and electrical stress. In this paper, in order to compensate the instability of oxide TFTs in the shift register, an oxide TFT with double gates, which can control VTH by varying the top gate bias (VTG) is adopted. The top gate of the double-gate TFT can be fabricated in the same process for the pixel IZO (Indium Zinc Oxide) so that an additional process only for the top gate is not required. Adequate VTG is provided timely, adaptively to the gate of the oxide TFTs to stabilize the threshold voltage. The fabrication result shows that the proposed shift register using VTG set at an adapted value become stable at 100℃ whereas the conventional one is mal-functioning. The optimum VTG varies from product to product and changes continuously over the lifetime of the display. Therefore, the feedback driving system suitable for the proposed shift register is required to search the optimum VTG. The system has two main functions

the first is to sense the current of shift register and the second is the searching algorithm for finding the optimum VTG. When the transistors are degraded by an external stress, the current of the whole shift registers is changed. The information about the VTH degradation in the shift register can be gathered via current sensing circuit. The sensed current is integrated to generate the output and is forwarded to an ADC. The binary-converted current of shift register is processed by the proposed algorithm in the digital domain for obtaining an optimum VTG and then the result is converted back to analog to generate VTG. The IC implementing such functions is fabricated in a 0.18 μm BCDMOS process. When the shift register current is measured on the conventional system with increasing temperature up to 80℃, it is increased to more than 10 times than that at the room temperature. However, the proposed feedback system keeps a highly stable (<13%) current level of shift register up to 80℃ with an optimized VTG.