Atomic Structure Analysis of Octahedral Rotations in Strained SrRuO3 Thin Films
SrRuO3 박막 내 팔면체 뒤틀림 현상의 원자 수준에서의 결정 구조 분석

DC Field Value Language
dc.description학위논문 (석사)-- 서울대학교 대학원 : 재료공학부, 2016. 2. 김미영.-
dc.description.abstractPhysical properties of perovskite oxides are strongly dependent on subtle structural deformation because of the large lattice-electron correlations, therefore it is essential to obtain accurate structural information to understand the underlying mechanism of structure-property relationship. Particularly, perovskite oxide thin films which are subject to the substrate-induced stress present a range of intriguing physical properties.. In this study, we investigated strain effects on SrRuO3 thin films by measuring RuO6 octahedral rotation across the interface using high resolution scanning transmission electron microscopy-annular bright field (STEM-ABF) imaging together with electron diffraction patterns, and the corresponding changes in electronic properties.
We compared the crystal structures of SrRuO3 thin films on two substrates, GdScO3 (GSO) and SrTiO3 (STO), which are chosen for inducing tensile/ compressive strain and having the orthorhombic and cubic structure respectively. HRTEM images and their fast Fourier transformed micrographs revealed that the SRO films consisted of different domains, with sustained and released octahedral rotation. High resolution STEM-ABF images of released octahedral rotation region demonstrate less-distorted octahedral rotation patterns both on GSO and STO substrates. Only difference was the interface region. On GSO substrate, including topmost layer of GSO, SRO has somewhat sustained octahedral rotation up to two unit cells, while on STO, there was almost no rotation throughout the whole film. These different results in interface area can be ascribed to the symmetry mismatch effect. Since in both cases, SRO films have mixed structure with no big distinction, electrical property shows similar data. This study demonstrates that the octahedral rotations can be understood the interplay between lattice mismatch and symmetry mismatch.
dc.description.tableofcontentsChapter 1 Introduction 1

Chapter 2 Literature Survey 5
2.1 Materials of Interest – SrRuO3 5
2.2 The experimental studies on SrRuO3 thin films 10
2.3 Importance of stuructural phase transition of SrRuO3 13
2.4 Octahedral rotations in ABO3 perovksite materials 15

Chapter 3 Experimental Details 18
3.1 Growth and characterization of SrRuO3 films 18
3.2 Transmission Electron Microscopy (TEM) analysis 20
3.3 Physical Properties Measurement System(PPMS) 20

Chapter 4 Results and Discussion 21
4.1 Growth and characterization of SrRuO3 films 21
4.2 Transmission Electron Microscopy (TEM) analysis 25
4.2.1 SrRuO3 thin films on GdScO3 25
4.2.1 SrRuO3 thin films on SrTiO3 35
4.3 Physical Properties Measurement System(PPMS) 42

Chapter 5 Conclusions 46

References 48

Abstract 50
dc.format.extent2863481 bytes-
dc.publisher서울대학교 대학원-
dc.subjectStrain effect-
dc.subjectoctahedral rotation-
dc.subjectlattice mismatch-
dc.subjectsymmetry mismatch-
dc.subjectSTEM-ABF imaging and SrRuO3 thin film-
dc.titleAtomic Structure Analysis of Octahedral Rotations in Strained SrRuO3 Thin Films-
dc.title.alternativeSrRuO3 박막 내 팔면체 뒤틀림 현상의 원자 수준에서의 결정 구조 분석-
dc.contributor.AlternativeAuthorKim, Eunju-
dc.contributor.affiliation공과대학 재료공학부-
Appears in Collections:
College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Materials Science and Engineering (재료공학부)Theses (Master's Degree_재료공학부)
Files in This Item:
  • mendeley

Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.