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Development of Sealant Detection Methods using Auto-Finding Algorithm in TFT-LCD Glass Bonding Process
자동 인식 알고리즘을 이용한 TFT-LCD 합착 공정에서의 Sealant 검출 방법 개발

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Authors
윤대건
Advisor
박희재
Major
공과대학 기계항공공학부
Issue Date
2016-02
Publisher
서울대학교 대학원
Keywords
SealantOtsu methodGamma correctionSub-pixelQuartic Facet modelDiscrete Orthogonal Polynomials
Description
학위논문 (석사)-- 서울대학교 대학원 : 기계항공공학부, 2016. 2. 박희재.
Abstract
Thin Film Transistor-Liquid Crystal Displays (TFT-LCDs) is most worldwide used device in display industry. In bonding process Color Filter (CF)-substrate and TFT-substrate, they are bonded by sealant which has various overlapped patterns. Measurement of sealant-width which provides evaluation of well-bonded condition is important.
Various overlapped patterns and substrate-glass make hard to detect sealant and measure sealant-width. In order to detect sealant, the proposed method automatically sets Area of Interest (AOI) for sealant-width measurement. The modified Otsu method is proposed to eliminate substrate-glass area except sealant area. Modified application of gamma correction is used to select threshold for extracting standard of sealant intensity. In these methods, sealant can be detected automatically and measured in pixel level.
For the precise measurement, quartic Facet model is proposed to convert pixel intensity to sub-pixel intensity. The Discrete Orthogonal Polynomials (DOP) are used to verify quartic Facet model.
The experimental result shows that new method has higher detection rate than conventional method and good repeatability of measurement than pixel level.
Language
English
URI
http://hdl.handle.net/10371/123870
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Mechanical Aerospace Engineering (기계항공공학부)Theses (Master's Degree_기계항공공학부)
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