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(A)Study on the fabrication and characterization of ferroelectric thin films for nonvolatile memory devices : 비휘발성 메모리소자를 위한 강유전 박막의 형성 및 특성 평가에 관한 연구

DC Field Value Language
dc.contributor.advisor주승기-
dc.contributor.author윤종인-
dc.date.accessioned2009-11-18-
dc.date.available2009-11-18-
dc.date.copyright2006.-
dc.date.issued2006-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000048695eng
dc.identifier.urihttps://hdl.handle.net/10371/12626-
dc.descriptionThesis(doctor`s)--서울대학교 대학원 :재료공학부,2006.eng
dc.format.extentix, 95 leaveseng
dc.language.isoeneng
dc.publisher서울대학교 대학원eng
dc.subjectPZTeng
dc.subjectPZTeng
dc.subject타이타늄eng
dc.subjectTieng
dc.subject강유전체eng
dc.subjectferroelectric materialeng
dc.subject비휘발성 기억소자eng
dc.subjectnon-volatile memoryeng
dc.subjectFeRAMeng
dc.subjectFeRAMeng
dc.subject저온 결정화eng
dc.subjectseed layereng
dc.subjectSOGeng
dc.subjectlow temperature crystallizationeng
dc.subjectSOGeng
dc.title(A)Study on the fabrication and characterization of ferroelectric thin films for nonvolatile memory deviceseng
dc.title.alternative비휘발성 메모리소자를 위한 강유전 박막의 형성 및 특성 평가에 관한 연구eng
dc.typeThesis-
dc.contributor.department재료공학부-
dc.description.degreeDoctoreng
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