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Research on vertically-stacked microscale organic resistive nonvolatile memory devices : 미소 단위로 수직으로 적층한 비휘발성 유기 저항 기억 장치에 대한 연구
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 이탁희 | - |
dc.contributor.author | 유대경 | - |
dc.date.accessioned | 2017-07-19T09:11:02Z | - |
dc.date.available | 2017-07-19T09:11:02Z | - |
dc.date.issued | 2015-02 | - |
dc.identifier.other | 000000024959 | - |
dc.identifier.uri | https://hdl.handle.net/10371/131629 | - |
dc.description | 학위논문 (석사)-- 서울대학교 대학원 : 물리·천문학부, 2015. 2. 이탁희. | - |
dc.description.abstract | PI:PCBM(polyimide (PI) and 6-phenyl-C61 butyric acid methyl ester (PCBM) ) is a promising organic memory material due to its low cost fabrication and solution processbility.. PI:PCBM shows that unipolar memory characteristic and have good memory ON-OFF ratio.The 7 µm × 7 µm cell size vertically-stacked organic memory devices were possible with an orthogonal photolithography technique by using a highly fluorinated photoresist. The vertically-stacked microscale organic memory devices showed high reproducibility with good endurance cycle and stability with long retention time over 104 s for both layers. With fluorous solvents, othogonality is an important property that is required to protect the underlying organic memory layers (PI:PCBM) from the addition of lithographic chemicals and allow the removal of the unused part of the deposited photoresist layer by the fluorent developing solvents.Using this highly fluorent material, we highly integrated polymer type memory. | - |
dc.description.tableofcontents | ABSTRACT Ⅰ
List of Figures Ⅳ Chapter 1: Introduction. 1 1.1 Organic resistive material 1 1.2 Micro-scale photolithography on organic resistive memory layer . 2 Chapter 2: Experimental Methods 5 2.1. Sample Preparation . 5 2.1.1. PI:PCBM preparation . 5 2.1.2. Orthogonal photolithography Solutions preparation . 5 2.2. Fabrication of vertically-stacked microscale organic resistive nonvolatile memory devices . 8 2.2.1. Deposition of PI:PCBM memory layer 8 2.2.2. Deposition of second AL electrode deposition 8 2.2.3 Fabrication of memory devices in second memory layer . 8 2.3 Measurement 9 2.3.1.Semiconductor analyzer system 9 2.3.2 Switching test 9 2.3.3 Endurance test . 9 2.3.4 Retention test 10 2.3.4 Statistical test 10 Chapter 3: Results and Discussions 11 3.1.First memory layer Properties. 11 3.2. Second memory layer Properties 14 3.3.Uniform parameter 18 3.4T EM images 19 Chapter 4: Conclusions 21 Appendix. 22 References 24 국문초록 (Abstract in Korean) 2 | - |
dc.format | application/pdf | - |
dc.format.extent | 2879074 bytes | - |
dc.format.medium | application/pdf | - |
dc.language.iso | en | - |
dc.publisher | 서울대학교 대학원 | - |
dc.subject | organic material | - |
dc.subject.ddc | 523 | - |
dc.title | Research on vertically-stacked microscale organic resistive nonvolatile memory devices | - |
dc.title.alternative | 미소 단위로 수직으로 적층한 비휘발성 유기 저항 기억 장치에 대한 연구 | - |
dc.type | Thesis | - |
dc.contributor.AlternativeAuthor | Daekyoung Yoo | - |
dc.description.degree | Master | - |
dc.citation.pages | 30 | - |
dc.contributor.affiliation | 자연과학대학 물리·천문학부 | - |
dc.date.awarded | 2015-02 | - |
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