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Study on the double threshold switching effect in bi-layer structure of PRAM and the feasibility for multi-level operation
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 김기범 | - |
dc.contributor.author | 전현구 | - |
dc.date.accessioned | 2009-11-25T02:34:10Z | - |
dc.date.available | 2009-11-25T02:34:10Z | - |
dc.date.copyright | 2006. | - |
dc.date.issued | 2006 | - |
dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047514 | eng |
dc.identifier.uri | https://hdl.handle.net/10371/14997 | - |
dc.description | Thesis(master`s)--서울대학교 대학원 :재료공학부,2006. | eng |
dc.format.extent | 74 leaves | eng |
dc.language.iso | en | - |
dc.publisher | 서울대학교 대학원 | eng |
dc.subject | 상변화 메모리 | eng |
dc.subject | PRAM | eng |
dc.subject | Ge2Sb2Te5 | eng |
dc.subject | Ge2Sb2Te5 | eng |
dc.subject | TiN | eng |
dc.subject | TiN | eng |
dc.subject | 다중 레벨 동작 | eng |
dc.subject | Multi-level operation | eng |
dc.subject | 이중 임계 스위칭 | eng |
dc.subject | Bi-layered structure | eng |
dc.subject | 직류 I-V특성 | eng |
dc.subject | Double threshold switching | eng |
dc.subject | 펄스 테스트 | eng |
dc.subject | DC I-V characteristic | eng |
dc.subject | 스퍼터 증착 | eng |
dc.subject | Pulse test | eng |
dc.subject | 저항 | eng |
dc.subject | Sputter Deposition | eng |
dc.subject | 비정질 | eng |
dc.subject | Resistance | eng |
dc.subject | 결정질 | eng |
dc.subject | amorphous | eng |
dc.subject | crystal | eng |
dc.title | Study on the double threshold switching effect in bi-layer structure of PRAM and the feasibility for multi-level operation | eng |
dc.type | Thesis | - |
dc.contributor.department | 재료공학부 | - |
dc.description.degree | Master | eng |
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