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Microscopic investigation of resistive switching in TiO₂thin film using conductive atomic force microscopy
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- Authors
- Advisor
- 황철성
- Issue Date
- 2008
- Publisher
- 서울대학교 대학원
- Keywords
- TiO₂ ; TiO₂ ; ReRAM ; ReRAM ; 저항변화메모리 ; resistive switching ; 필라멘트 ; CAFM ; CAFM ; filament
- Description
- Thesis(masters) --서울대학교 대학원 :재료공학부,2008.2.
- Language
- English
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000041115
https://hdl.handle.net/10371/14998
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