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SnAgCu 솔더 라인의 electromigration 특성 분석
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 주영창 | - |
dc.contributor.author | 고민구 | - |
dc.date.accessioned | 2009-11-25T03:01:21Z | - |
dc.date.available | 2009-11-25T03:01:21Z | - |
dc.date.copyright | 2006. | - |
dc.date.issued | 2006 | - |
dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047489 | kor |
dc.identifier.uri | https://hdl.handle.net/10371/15058 | - |
dc.description | 학위논문(석사)--서울대학교 대학원 :재료공학부,2006. | kor |
dc.format.extent | xi, 86 장 | kor |
dc.language.iso | ko | - |
dc.publisher | 서울대학교 대학원 | kor |
dc.subject | electromigration | kor |
dc.subject | electromigration | kor |
dc.subject | 잠복 시간 | kor |
dc.subject | incubation time | kor |
dc.subject | 활성화 에너지 | kor |
dc.subject | activation energy | kor |
dc.subject | 유효 전하수(Z*) | kor |
dc.subject | effective charge number | kor |
dc.title | SnAgCu 솔더 라인의 electromigration 특성 분석 | kor |
dc.type | Thesis | - |
dc.contributor.department | 재료공학부 | - |
dc.description.degree | Master | kor |
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