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그래픽 프로세싱 유닛을 이용한 TFT-LCD 공정에서의 결함 검사 시스템의 개발 : Development of Defect Inspection System Development of Defect Inspection System

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Authors

최순민

Advisor
박희재
Major
기계항공공학부
Issue Date
2011-02
Publisher
서울대학교 대학원
Keywords
머신 비전결함GPU고속 푸리에 변환AOIMachine VisionDefectWaveletFourier Transform
Description
학위논문 (석사)-- 서울대학교 대학원 : 기계항공공학부, 2011.2. 박희재.
Language
kor
URI
https://hdl.handle.net/10371/157370

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