Publications
Detailed Information
AFM을 이용한 유전체 박막의 전기적 특성 연구 : Electrical characterization of dielectric films using Atomic Force Microscopy
Cited 0 time in
Web of Science
Cited 0 time in Scopus
- Authors
- Advisor
- 국양
- Major
- 나노융합학과
- Issue Date
- 2011-02
- Publisher
- 서울대학교 대학원
- Keywords
- Atomic Force Microscopy ; 유전체 ; 저항 스위칭 메모리 ; TiO2 ; ZrxHf1-xOy ; 누설 전류. ; Dielectric films ; Resistive Switching Memory ; Leakage current.
- Description
- 학위논문 (석사)-- 서울대학교 대학원 : 나노융합학과, 2011.2. 국양.
- Language
- kor
- URI
- https://hdl.handle.net/10371/157440
http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000030647
- Files in This Item:
- There are no files associated with this item.
Item View & Download Count
Items in S-Space are protected by copyright, with all rights reserved, unless otherwise indicated.