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Light and temperature effects on negative bias-induced instability of HfInZnO amorphous oxide thin film transistor : HfInZnO로 구성된 산화물 박막 소자의 전압, 빛, 온도에 의한 전기적 특성 변화
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 박병국 | - |
| dc.contributor.author | 권대웅 | - |
| dc.date.accessioned | 2019-07-09T16:09:16Z | - |
| dc.date.available | 2019-07-09T16:09:16Z | - |
| dc.date.issued | 2011-02 | - |
| dc.identifier.other | 000000030645 | - |
| dc.identifier.uri | https://hdl.handle.net/10371/157442 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000030645 | ko_KR |
| dc.description | 학위논문 (석사)-- 서울대학교 대학원 : 나노융합학과, 2011.2. 박병국. | - |
| dc.format.extent | iv, 59 leaves | - |
| dc.language.iso | eng | - |
| dc.publisher | 서울대학교 대학원 | - |
| dc.subject | HIZO 박막소자의 전기적 특성변화 | - |
| dc.subject | 빛에 의한 전기적 특성변화 | - |
| dc.subject | 온도변화로 인한 전기적 특성변화 | - |
| dc.subject | Instability of HIZO TFT | - |
| dc.subject | Bias-induced instability of HIZO TFT | - |
| dc.subject | Temperature dependence of HIZO TFT | - |
| dc.subject | Light-induced instability of HIZO TFT | - |
| dc.title | Light and temperature effects on negative bias-induced instability of HfInZnO amorphous oxide thin film transistor | - |
| dc.title.alternative | HfInZnO로 구성된 산화물 박막 소자의 전압, 빛, 온도에 의한 전기적 특성 변화 | - |
| dc.type | Thesis | - |
| dc.type | Dissertation | - |
| dc.description.degree | Master | - |
| dc.contributor.affiliation | 나노융합학과 | - |
| dc.date.awarded | 2011-02 | - |
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