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EELS investigation of defects in transition metal oxide and chemical reaction at the interface between metal and oxide

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Authors

장재혁

Advisor
김미영
Major
재료공학부
Issue Date
2011-08
Publisher
서울대학교 대학원
Keywords
금속 전극확산계면 반응전자구조결정구조유전막전자에너지손실분광법(EELS)InterfaceMetal diffusion and ReactionElectronic StructureElectron Energy Loss SpectroscopyHigh-kNano device
Description
학위논문 (박사)-- 서울대학교 대학원 : 재료공학부, 2011.8. 김미영.
Language
eng
URI
https://hdl.handle.net/10371/158962

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