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(The) characteristics and reliability of short channel a-Si:H TFT and SPC-Si TFT under bias temperature stress : Short channel 비정질 실리콘 TFT 및 SPC 실리콘 TFT의 특성 및 신뢰성 연구
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 한민구 | - |
| dc.contributor.author | 박상근 | - |
| dc.date.accessioned | 2019-07-10T04:21:05Z | - |
| dc.date.available | 2019-07-10T04:21:05Z | - |
| dc.date.issued | 2011-02 | - |
| dc.identifier.other | 000000029037 | - |
| dc.identifier.uri | https://hdl.handle.net/10371/159069 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000029037 | ko_KR |
| dc.description | 학위논문 (박사)-- 서울대학교 대학원 : 전기· 컴퓨터공학부, 2011.2. 한민구. | - |
| dc.format.extent | xvi, 160 장 | - |
| dc.language.iso | eng | - |
| dc.publisher | 서울대학교 대학원 | - |
| dc.subject | 수소화된 비정질 실리콘 박막소자 | - |
| dc.subject | 짧은 채널 비정질 실리콘 박막소자 | - |
| dc.subject | 전기적 신뢰성 | - |
| dc.subject | 광 열화 안정성 | - |
| dc.subject | 고형결정화 실리콘 박막소자 | - |
| dc.subject | 누설전류 | - |
| dc.subject | hydrogenated amorphous silicon thin film transistor | - |
| dc.subject | a-Si:H TFT | - |
| dc.subject | short channel a-Si:H TFT | - |
| dc.subject | electrical stability | - |
| dc.subject | light induced stability | - |
| dc.subject | solid phase crystallization silicon thin film transistor | - |
| dc.subject | SPC-Si TFT | - |
| dc.subject | leakage current | - |
| dc.title | (The) characteristics and reliability of short channel a-Si:H TFT and SPC-Si TFT under bias temperature stress | - |
| dc.title.alternative | Short channel 비정질 실리콘 TFT 및 SPC 실리콘 TFT의 특성 및 신뢰성 연구 | - |
| dc.type | Thesis | - |
| dc.type | Dissertation | - |
| dc.description.degree | Doctor | - |
| dc.contributor.affiliation | 전기· 컴퓨터공학부 | - |
| dc.date.awarded | 2011-02 | - |
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