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전해질 - 산화막 - 실리콘 시스템의 터널링 전류 해석 : Analysis of tunneling current in the Electrolyte - Oxide - Silicon system
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 박영준 | - |
| dc.contributor.author | 최연규 | - |
| dc.date.accessioned | 2019-07-10T05:16:07Z | - |
| dc.date.available | 2019-07-10T05:16:07Z | - |
| dc.date.issued | 2011-02 | - |
| dc.identifier.other | 000000029964 | - |
| dc.identifier.uri | https://hdl.handle.net/10371/159570 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000029964 | ko_KR |
| dc.description | 학위논문 (석사)-- 서울대학교 대학원 : 전기. 컴퓨터공학부, 2011.2. 박영준. | - |
| dc.format.extent | vii, 57 장 | - |
| dc.language.iso | kor | - |
| dc.publisher | 서울대학교 대학원 | - |
| dc.subject | EOS | - |
| dc.subject | 터널링 전류 | - |
| dc.subject | EDL | - |
| dc.subject | 전기 도금 | - |
| dc.subject | 산화막 열화 | - |
| dc.subject | tunneling current | - |
| dc.subject | Electroplating | - |
| dc.subject | oxide degradation | - |
| dc.title | 전해질 - 산화막 - 실리콘 시스템의 터널링 전류 해석 | - |
| dc.title.alternative | Analysis of tunneling current in the Electrolyte - Oxide - Silicon system | - |
| dc.type | Thesis | - |
| dc.type | Dissertation | - |
| dc.description.degree | Master | - |
| dc.contributor.affiliation | 전기. 컴퓨터공학부 | - |
| dc.date.awarded | 2011-02 | - |
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