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HfInZnO 박막 트랜지스터에서의 전기적 스트레스에 대한 신뢰성 연구 : Investigation of stress instability in HfInZnO thin film transistor
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- Authors
- Advisor
- 박병국
- Major
- 전기. 컴퓨터공학부
- Issue Date
- 2011-02
- Publisher
- 서울대학교 대학원
- Keywords
- 산화물 박막 트랜지스터 ; HfInZnO ; Bias Temperature Instability ; Stretched-exponential model ; Bias Illumination Stress Instability ; 광 주입 차단층 구조 ; Oxide semiconductor Thin FIlm Transistor (TFT) ; Photo injection blocking layer
- Description
- 학위논문 (석사)-- 서울대학교 대학원 : 전기. 컴퓨터공학부, 2011.2. 박병국.
- Language
- kor
- URI
- https://hdl.handle.net/10371/159595
http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000029948
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