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Abnormal object detection using second-order spatio-temporal background model : 영상분포의 변화 학습을 통한 불량 검출
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- Authors
- Advisor
- 유석인
- Major
- 전기. 컴퓨터공학부
- Issue Date
- 2011-02
- Publisher
- 서울대학교 대학원
- Keywords
- 배경 제거 ; 불량 검출 ; 전경 검출 ; 물체 인식 ; 모양 매칭 ; background subtraction ; defect detection ; foreground detection ; object recognition ; shape matching
- Description
- 학위논문 (석사)-- 서울대학교 대학원 : 전기. 컴퓨터공학부, 2011.2. 유석인.
- Language
- eng
- URI
- https://hdl.handle.net/10371/159701
http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000029960
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