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Characteristics of partial discharge induced by continuous X-ray exposure of void defects in insulator

Cited 5 time in Web of Science Cited 9 time in Scopus
Authors

Shin, Ji-Yong; Kim, Eun-Hee; Kim, Sung-Wook; Jo, Hyang-Eun; Jung, Jae-Ryong

Issue Date
2019-10
Publisher
Institute of Electrical and Electronics Engineers
Citation
IEEE Transactions on Dielectrics and Electrical Insulation, Vol.26 No.5, pp.1441-1447
Abstract
Partial discharge (PD) diagnosis is a part of a routine testing of solid insulating materials to detect void defects. However, the conventional diagnosis is prone to inception delays due to lack of initiatory electron production, especially inside small voids. In this study, we employed continuous irradiation of X-rays to induce and sustain discharge inside the voids. The PD characteristics of void samples under different exposure rates of X-rays were observed. Compared with the conventional diagnosis, this continuous X-ray-induced partial discharge diagnosis enhanced the detection efficiency by eliminating the inception delays and reducing the discharge inception voltage. We focused on the changes in PD characteristics due to varying X-ray exposure rates. As the exposure rates were increased, the number of PD signals per minute increased while the average pulse height of PD signals decreased. Continuous X-ray exposure at rates between 0.5 and 294 mR/s successfully eliminated the inception delays even when the voids were as small as 1.63 mm in diameter of equivalent spherical volume.
ISSN
1070-9878
Language
ENG
URI
https://hdl.handle.net/10371/163923
DOI
https://doi.org/10.1109/TDEI.2019.008052
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