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Cephalometric landmark detection via global and local encoders and patch-wise attentions

Cited 3 time in Web of Science Cited 6 time in Scopus
Authors

Lee, Minkyung; Chung, Minyoung; Shin, Yeong-Gil

Issue Date
2022-01-22
Publisher
Elsevier BV
Citation
Neurocomputing, Vol.470, pp.182-189
Abstract
Cephalometric landmark detection performs an important role in a diagnostic measurements for orthodontic treatment plans. As manual depiction of landmarks is a time-consuming and tedious task, the development of an automated detection algorithm for daily clinics is in high demand. In this study, we propose a single-passing convolutional neural network that performs an accurate landmark detection in a hierarchical fashion. The proposed network first extracts global contexts by regressing initial positions of all the landmarks. Subsequently, local features are extracted from landmark-centered patches, which are obtained through global regression. The encoded global and local features are concatenated and weighed through a novel patch-wise attention module to weigh the relative importance. The experimental results demonstrate that our proposed local patch-wise attention mechanism performs a significant role in accurate detection. The proposed method outperformed other state-of-the-art methods by improving the successful detection rate by approximately 1 ti 2%. The proposed method suggests that a structured attention, which is developed in a patch-wise fashion, significantly enhances the local feature encoders to further improve the final accuracy. (c) 2021 Elsevier B.V. All rights reserved.
ISSN
0925-2312
URI
https://hdl.handle.net/10371/179352
DOI
https://doi.org/10.1016/j.neucom.2021.11.003
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