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An In-Depth I/O Pattern Analysis in HPC Systems

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dc.contributor.authorBang, Jiwoo-
dc.contributor.authorKim, Chungyong-
dc.contributor.authorWu, Kesheng-
dc.contributor.authorSim, Alex-
dc.contributor.authorByna, Suren-
dc.contributor.authorSung, Hanul-
dc.contributor.authorEom, Hyeonsang-
dc.date.accessioned2022-06-24T00:26:23Z-
dc.date.available2022-06-24T00:26:23Z-
dc.date.created2022-05-09-
dc.date.issued2021-01-
dc.identifier.citationProceedings - 2021 IEEE 28th International Conference on High Performance Computing, Data, and Analytics, HiPC 2021, pp.400-405-
dc.identifier.issn1094-7256-
dc.identifier.urihttps://hdl.handle.net/10371/183768-
dc.description.abstract© 2021 IEEE.High-performance computing (HPC) systems consist of thousands of compute nodes, storage systems and high-speed networks, providing multiple layers of I/O stack with high complexity. By adjusting the diverse configuration settings that HPC systems provide, the I/O performance of applications can be improved. However, it is challenging to identify the optimal configuration settings without a thorough knowledge of the system, as each of the different I/O characteristics of applications can be an important factor for parameter decision. In this paper, we use multiple machine learning approaches to perform an in-depth analysis on I/O behaviors of HPC applications and to search for the optimal configuration settings for jobs sharing similar I/O characteristics. Improved by maximum 0.07 R-squared score, our results in overall show that jobs run on the HPC systems can obtain the predicted I/O performance for different configuration parameters with a high accuracy, using the proposed machine learning-based prediction models.-
dc.language영어-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleAn In-Depth I/O Pattern Analysis in HPC Systems-
dc.typeArticle-
dc.identifier.doi10.1109/HiPC53243.2021.00056-
dc.citation.journaltitleProceedings - 2021 IEEE 28th International Conference on High Performance Computing, Data, and Analytics, HiPC 2021-
dc.identifier.wosid000782316500043-
dc.identifier.scopusid2-s2.0-85125625317-
dc.citation.endpage405-
dc.citation.startpage400-
dc.description.isOpenAccessN-
dc.contributor.affiliatedAuthorEom, Hyeonsang-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
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