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Ultra-thin ferroelectrics
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Qiao, H. | - |
dc.contributor.author | Wang, C. | - |
dc.contributor.author | Choi, W.S. | - |
dc.contributor.author | Park, M.H. | - |
dc.contributor.author | Kim, Y. | - |
dc.date.accessioned | 2022-06-24T00:28:36Z | - |
dc.date.available | 2022-06-24T00:28:36Z | - |
dc.date.created | 2022-05-24 | - |
dc.date.issued | 2021-07 | - |
dc.identifier.citation | Materials Science and Engineering: R: Reports, Vol.145, p. 100622 | - |
dc.identifier.issn | 0927-796X | - |
dc.identifier.uri | https://hdl.handle.net/10371/183853 | - |
dc.description.abstract | Device applications of ferroelectrics have not only utilized the switchable polarization but also adopted myriads of emerging physical properties. In particular, ferroelectrics in ultra-thin limit have recently attracted considerable scientific and technological interest owing to the increasing demand for miniaturization of electronic devices. In the last two decades, ultra-thin ferroelectrics have rapidly developed with the advances in the theoretical calculations, synthesis, and characterization techniques. However, atomic-scale realization and rigorous characterization of ultra-thin ferroelectricity remain challenging. In this review, we summarize state-of-the-art researches on ultra-thin ferroelectrics. We provide a brief overview of the history and underlying mechanism of ferroelectrics in the context of ultra-thin ferroelectrics. In particular, we discuss complex transition metal oxide ultra-thin ferroelectrics, ferroelectric two-dimensional materials, and fluorite HfO2-based ultra-thin ferroelectrics. Further, we discuss the characterization techniques used to verify the ultra-thin limit of ferroelectricity, followed by device applications based on various emergent properties of ultra-thin ferroelectrics. Finally, we provide a brief conclusion and outlook. © 2021 The Author(s) | - |
dc.language | 영어 | - |
dc.publisher | Elsevier BV | - |
dc.title | Ultra-thin ferroelectrics | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.mser.2021.100622 | - |
dc.citation.journaltitle | Materials Science and Engineering: R: Reports | - |
dc.identifier.wosid | 000669064900001 | - |
dc.identifier.scopusid | 2-s2.0-85106381301 | - |
dc.citation.startpage | 100622 | - |
dc.citation.volume | 145 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Park, M.H. | - |
dc.type.docType | Review | - |
dc.description.journalClass | 1 | - |
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