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Ultra-thin ferroelectrics

DC Field Value Language
dc.contributor.authorQiao, H.-
dc.contributor.authorWang, C.-
dc.contributor.authorChoi, W.S.-
dc.contributor.authorPark, M.H.-
dc.contributor.authorKim, Y.-
dc.date.accessioned2022-06-24T00:28:36Z-
dc.date.available2022-06-24T00:28:36Z-
dc.date.created2022-05-24-
dc.date.issued2021-07-
dc.identifier.citationMaterials Science and Engineering: R: Reports, Vol.145, p. 100622-
dc.identifier.issn0927-796X-
dc.identifier.urihttps://hdl.handle.net/10371/183853-
dc.description.abstractDevice applications of ferroelectrics have not only utilized the switchable polarization but also adopted myriads of emerging physical properties. In particular, ferroelectrics in ultra-thin limit have recently attracted considerable scientific and technological interest owing to the increasing demand for miniaturization of electronic devices. In the last two decades, ultra-thin ferroelectrics have rapidly developed with the advances in the theoretical calculations, synthesis, and characterization techniques. However, atomic-scale realization and rigorous characterization of ultra-thin ferroelectricity remain challenging. In this review, we summarize state-of-the-art researches on ultra-thin ferroelectrics. We provide a brief overview of the history and underlying mechanism of ferroelectrics in the context of ultra-thin ferroelectrics. In particular, we discuss complex transition metal oxide ultra-thin ferroelectrics, ferroelectric two-dimensional materials, and fluorite HfO2-based ultra-thin ferroelectrics. Further, we discuss the characterization techniques used to verify the ultra-thin limit of ferroelectricity, followed by device applications based on various emergent properties of ultra-thin ferroelectrics. Finally, we provide a brief conclusion and outlook. © 2021 The Author(s)-
dc.language영어-
dc.publisherElsevier BV-
dc.titleUltra-thin ferroelectrics-
dc.typeArticle-
dc.identifier.doi10.1016/j.mser.2021.100622-
dc.citation.journaltitleMaterials Science and Engineering: R: Reports-
dc.identifier.wosid000669064900001-
dc.identifier.scopusid2-s2.0-85106381301-
dc.citation.startpage100622-
dc.citation.volume145-
dc.description.isOpenAccessN-
dc.contributor.affiliatedAuthorPark, M.H.-
dc.type.docTypeReview-
dc.description.journalClass1-
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