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A Contactless PCBA Defect Detection Method: Convolutional Neural Networks with Thermographic Images

Cited 13 time in Web of Science Cited 16 time in Scopus
Authors

Jeon, Mingu; Yoo, Siyun; Kim, Seong-Woo

Issue Date
2022-03
Publisher
Institute of Electrical and Electronics Engineers Inc.
Citation
IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol.12 No.3, pp.489-501
Abstract
IEEEIn the mass production of electronic products, in-circuit-test and printed circuit board assembly (PCBA) quality tests are performed. In-circuit-test (ICT) measures resistance values and capacitance, but not only does it require the use of a fixture, that is expensive and requires frequent replacement, but also the fixture’s needles may cause PCBA defects. To overcome these limitations, various researches tried to replace ICT using visual inspection methods, however visual inspection methods cannot be applied to chip resistor and chip capacitors, that do not have externally visible characteristics. In this paper, we propose a contactless inspection method that can detect PCBA defects without the use of the fixture and ICT by using the comparison of thermal images and deep learning analysis. We review existing contactless inspection methods and compare them with our proposed thermal image analysis method. We analyzed thermal images by applying structural similarity index map as a rule-based object detection method, we used convolutional neural networks (CNN), regions with CNN features, and an autoencoder as deep learning analysis methods. As a result, we achieved highly accurate defective component detection and location in real-time.
ISSN
2156-3950
URI
https://hdl.handle.net/10371/184192
DOI
https://doi.org/10.1109/TCPMT.2022.3147319
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