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Unlocking Wordline-level Parallelism for Fast Inference on RRAM-based DNN Accelerator

DC Field Value Language
dc.contributor.authorPark, Yeonhong-
dc.contributor.authorLee, Seung Yul-
dc.contributor.authorShin, Hoon-
dc.contributor.authorHeo, Jun-
dc.contributor.authorHam, Tae Jun-
dc.contributor.authorLee, Jae Wook-
dc.date.accessioned2022-10-17T03:51:51Z-
dc.date.available2022-10-17T03:51:51Z-
dc.date.created2022-06-07-
dc.date.issued2020-11-
dc.identifier.citationIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, p. 103-
dc.identifier.issn1092-3152-
dc.identifier.urihttps://hdl.handle.net/10371/186111-
dc.description.abstract© 2020 Association on Computer Machinery.In-memory computing is rapidly rising as a viable solution that can effectively accelerate neural networks by overcoming the memory wall. Resistive RAM (RRAM) crossbar array is in the spotlight as a building block for DNN inference accelerators since it can perform a massive amount of dot products in memory in an area- and power-efficient manner. However, its in-memory computation is vulnerable to errors due to the non-ideality of RRAM cells. This error-prone nature of RRAM crossbar limits its wordline-level parallelism as activating a large number of wordlines accumulates non-zero current contributions from RRAM cells in the high-resistance state as well as current deviations from individual cells, leading to a significant accuracy drop. To improve performance by increasing the maximum number of concurrently activated wordlines, we propose two techniques. First, we introduce a lightweight scheme that effectively eliminates the current contributions from high-resistance state cells. Second, based on the observation that not all layers in a neural network model have the same error rates and impact on the inference accuracy, we propose to allow different layers to activate non-uniform numbers of wordlines concurrently. We also introduce a systematic methodology to determine the number of concurrently activated wordlines for each layer with a goal of optimizing performance, while minimizing the accuracy degradation. Our proposed techniques increase the inference throughput by 3-10× with a less than 1% accuracy drop over three datasets. Our evaluation also demonstrates that this benefit comes with a small cost of only 8.2% and 5.3% increase in area and power consumption, respectively.-
dc.language영어-
dc.publisherICCAD-
dc.titleUnlocking Wordline-level Parallelism for Fast Inference on RRAM-based DNN Accelerator-
dc.typeArticle-
dc.identifier.doi10.1145/3400302.3415664-
dc.citation.journaltitleIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers-
dc.identifier.wosid000671087100045-
dc.identifier.scopusid2-s2.0-85097956354-
dc.citation.startpage103-
dc.description.isOpenAccessN-
dc.contributor.affiliatedAuthorLee, Jae Wook-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
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