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Uni-modal retroreflection in multi-modal elastic wave fields

DC Field Value Language
dc.contributor.authorLee, Jeseung-
dc.contributor.authorPark, Jooa-
dc.contributor.authorPark, Chan Wook-
dc.contributor.authorCho, Seung Hyun-
dc.contributor.authorKim, Yoon Young-
dc.date.accessioned2022-10-26T00:27:57Z-
dc.date.available2022-10-26T00:27:57Z-
dc.date.created2022-09-29-
dc.date.issued2022-10-
dc.identifier.citationInternational Journal of Mechanical Sciences, Vol.232, p. 107655-
dc.identifier.issn0020-7403-
dc.identifier.urihttps://hdl.handle.net/10371/186696-
dc.description.abstract© 2022 Elsevier LtdThe phenomenon of retroreflection of light characterized by a single transversely polarized wave has been extensively explored. However, the phenomenon of retroreflection of a longitudinally polarized elastic wave in a solid medium is far behind the current theory because an incident longitudinal wave can be diffusively reflected into multiple wave modes, both longitudinal and transverse. Here, our experiments show that a uniquely engineered meta-corner reflector can perfectly retroreflect an incident longitudinal wave onto the same longitudinal wave without generating a transverse wave. The meta-corner reflector consisted of a novel sequential stack of a full longitudinal-to-transverse mode-converting layer and an angle-tuned corner reflector. We present a theoretical foundation for retroreflection and its critical application in measuring the thickness of a thin film coated on a substrate that is usually difficult to measure.-
dc.language영어-
dc.publisherPergamon Press Ltd.-
dc.titleUni-modal retroreflection in multi-modal elastic wave fields-
dc.typeArticle-
dc.identifier.doi10.1016/j.ijmecsci.2022.107655-
dc.citation.journaltitleInternational Journal of Mechanical Sciences-
dc.identifier.wosid000862831500002-
dc.identifier.scopusid2-s2.0-85136156534-
dc.citation.startpage107655-
dc.citation.volume232-
dc.description.isOpenAccessN-
dc.contributor.affiliatedAuthorKim, Yoon Young-
dc.type.docTypeArticle-
dc.description.journalClass1-
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