Sub-cell characterization of two-terminal perovskite/silicon tandem solar cells

Abstract

Although significant improvements in performance have been reported for monolithic perovskite/silicon tandem solar cells (PVSK/Si TSCs), the lack of simple electrical characterization methods impedes further development of monolithic TSCs. In this article, we report comprehensive electrical characterization methods that can accurately and easily analyze the sub-cells of two-terminal PVSK/Si TSCs. Using a highly efficient three-terminal PVSK/Si TSC conceived for the sub-cell analysis, fundamental electrical characterization methods, such as J-V characteristics, external quantum efficiency, impedance spectroscopy, and thermal admittance spectroscopy, are investigated to suggest a characterization platform for the sub-cell analysis of monolithic two-terminal PVSK/Si TSCs.