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√2×√2 R45∘ surface reconstruction and electronic structure of BaSnO 3 film : root 2 x root 2R45 degrees surface reconstruction and electronic structure of BaSnO3 film 2 × 2 R45° surface reconstruction and electronic structure of BaSnO3 film

Cited 4 time in Web of Science Cited 4 time in Scopus
Authors

Soltani, Shoresh; Hong, Sungyun; Kim, Bongju; Kim, Donghan; Jung, Jong Keun; Sohn, Byungmin; Noh, Tae Won; Char, Kookrin; Kim, Changyoung

Issue Date
2020-05
Publisher
American Chemical Society
Citation
Physical Review Materials, Vol.4 No.5, p. 055003
Abstract
We studied the surface and electronic structures of barium stannate (BaSnO3) thin films by low-energy electron diffraction (LEED) and angle-resolved photoemission spectroscopy (ARPES) techniques. BaSnO3/Ba0.96La0.04SnO3/SrTiO3 (10 nm/100 nm/0.5 mm) samples were grown using the pulsed-laser deposition (PLD) method and were ex situ transferred from the PLD chamber to ultrahigh vacuum (UHV) chambers for annealing, LEED, and ARPES studies. UHV annealing starting from 300 degrees C up to 550 degrees C, followed by LEED and ARPES measurements, show 1 x 1 surfaces with nondispersive energy-momentum bands. The 1 x 1 surface reconstructs into a root 2. x root 2R45 degrees one at an annealing temperature of 700 degrees C where the ARPES data show clear dispersive bands with a valence band maximum located around 3.3 eV below the Fermi level. While the root 2 x root 2R45 degrees surface reconstruction is stable under further UHV annealing, it is reversed to a 1 x 1 surface by annealing the sample in 400 mTorr oxygen at 600 degrees C. Another UHV annealing at 600 degrees C, followed by LEED and ARPES measurements, suggests that LEED root 2 x root 2R45 degrees surface reconstruction and ARPES dispersive bands are reproduced. Our results provide a better picture of the electronic structure of BaSnO3 surfaces and are suggestive of the role of oxygen vacancies in reversible root 2 x root 2R45 degrees surface reconstruction.
ISSN
2475-9953
URI
https://hdl.handle.net/10371/195899
DOI
https://doi.org/10.1103/PhysRevMaterials.4.055003
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