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Analytical relationship between polarized reflectivities on the specular surface
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Sohn, B. J. | - |
dc.contributor.author | Lee, Sang-Moo | - |
dc.date.accessioned | 2024-05-07T02:04:34Z | - |
dc.date.available | 2024-05-07T02:04:34Z | - |
dc.date.created | 2021-02-26 | - |
dc.date.issued | 2013-04 | - |
dc.identifier.citation | International Journal of Remote Sensing, Vol.34 No.7, pp.2368-2374 | - |
dc.identifier.issn | 0143-1161 | - |
dc.identifier.uri | https://hdl.handle.net/10371/201051 | - |
dc.description.abstract | An analytical expression of the relationship between polarized reflectivities over the planar surface is obtained. A comparison with the reflectivities calculated using the Fresnel equations for a given refractive index and viewing angle demonstrated that the Hong approximation', which causes erroneous results, is no longer necessary and should be replaced by an analytical expression. | - |
dc.language | 영어 | - |
dc.publisher | Taylor & Francis | - |
dc.title | Analytical relationship between polarized reflectivities on the specular surface | - |
dc.type | Article | - |
dc.identifier.doi | 10.1080/01431161.2012.744490 | - |
dc.citation.journaltitle | International Journal of Remote Sensing | - |
dc.identifier.wosid | 000315722200007 | - |
dc.identifier.scopusid | 2-s2.0-84872347354 | - |
dc.citation.endpage | 2374 | - |
dc.citation.number | 7 | - |
dc.citation.startpage | 2368 | - |
dc.citation.volume | 34 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Sohn, B. J. | - |
dc.contributor.affiliatedAuthor | Lee, Sang-Moo | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.subject.keywordPlus | SMALL-SCALE ROUGHNESS | - |
dc.subject.keywordPlus | REFRACTIVE-INDEX | - |
dc.subject.keywordPlus | MICROWAVE | - |
dc.subject.keywordPlus | EMISSIVITY | - |
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- College of Natural Sciences
- Department of Earth and Environmental Sciences
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