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Robustness of amorphous silicon during the initial lithiation/delithiation cycle

Cited 51 time in Web of Science Cited 55 time in Scopus
Authors

Berla, Lucas A.; Lee, Seok Woo; Ryu, Ill; Cui, Yi; Nix, William D.

Issue Date
2014-07
Publisher
ELSEVIER SCIENCE BV
Citation
JOURNAL OF POWER SOURCES, Vol.258, pp.253-259
Abstract
Recent research on the electrochemical lithiation of amorphous silicon nanoparticles shows that amorphous silicon is more fracture resistant than crystalline silicon during lithiation. Nanoparticles of amorphous silicon can be lithiated and delithiated without any fracture at all. To fully exploit the potential of using amorphous silicon as electrodes for lithium ion batteries it is important to determine if larger, micron-sized, amorphous silicon structures can be lithiated and delithiated without fracture. Here we study the morphologies of initially amorphous silicon rnicropillars (similar to 2.3 mu m tall) both before and after electrochemical lithiation and delithiation. No internal or external cohesive cracking is detected in lithiated pillars for any of the pillar sizes studied. Delithiated pillars exhibit some delamination at the interface between the pillar and the underlying nickel substrate. For larger diameter pillars, the initiated interfacial crack is driven upward into the delithiated pillar as the crack propagates radially inward. However, no cohesive fracture unrelated to interfacial cracking is seen in even the largest delithiated pillars. Finite element modeling provides support for the observation that the cohesive fracture resistance of amorphous silicon micropillars is representative of the fracture resistance of amorphous silicon microparticles of comparable dimensions. (C) 2014 Elsevier B.V. All rights reserved.
ISSN
0378-7753
URI
https://hdl.handle.net/10371/201269
DOI
https://doi.org/10.1016/j.jpowsour.2014.02.032
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Ryu, Ill류일
조교수
  • College of Engineering
  • Department of Materials Science & Engineering
Research Area Fundamental deformation mechanisms, Optimal desing in nanostructures, Reliability Analysis in Nanostructures

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