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Direct measurement of quantum phases in graphene via photoemission spectroscopy

Cited 62 time in Web of Science Cited 68 time in Scopus
Authors

Hwang, Choongyu; Park, Cheol-Hwan; Siegel, David A.; Fedorov, Alexei V.; Louie, Steven G.; Lanzara, Alessandra

Issue Date
2011-09
Publisher
American Physical Society
Citation
Physical Review B, Vol.84 No.12, p. 125422
Abstract
Quantum phases provide us with important information for understanding the fundamental properties of a system. However, the observation of quantum phases, such as Berry's phase and the sign of the matrix element of the Hamiltonian between two nonequivalent localized orbitals in a tight-binding formalism, has been challenged by the presence of other factors, e.g., dynamic phases and spin or valley degeneracy, and the absence of methodology. Here, we report a way to directly access these quantum phases, through polarization-dependent angle-resolved photoemission spectroscopy (ARPES), using graphene as a prototypical two-dimensional material. We show that the momentum- and polarization-dependent spectral intensity provides direct measurements of (i) the phase of the band wavefunction and (ii) the sign of matrix elements for nonequivalent orbitals. Upon rotating light polarization by π/2, we found that graphene with a Berry's phase of nπ (n=1 for single- and n=2 for double-layer graphene for Bloch wavefunction in the commonly used form) exhibits the rotation of ARPES intensity by π/n, and that ARPES signals reveal the signs of the matrix elements in both single- and double-layer graphene. The method provides a technique to directly extract fundamental quantum electronic information on a variety of materials. © 2011 American Physical Society.
ISSN
2469-9950
URI
https://hdl.handle.net/10371/202346
DOI
https://doi.org/10.1103/PhysRevB.84.125422
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  • College of Natural Sciences
  • Department of Physics and Astronomy
Research Area Condensed Matter Physics, Nanoscale Photonics, Nanoscale Physics, 나노 물리와 나노 광자학, 응집 물질 물리

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