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Enhanced Charge Injection Properties of Organic Field Effect Transistor by Molecular Implantation Doping (vol 31, 1806697, 2019)

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Authors

Kim, Youngrok; Chung, Seungjun; Cho, Kyungjune; Harkin, David; Hwang, Wang-Taek; Yoo, Daekyoung; Kim, Jae-Keun; Lee, Woocheol; Song, Younggul; Ahn, Heebeom; Hong, Yongtaek; Sirringhaus, Henning; Kang, Keehoon; Lee, Takhee

Issue Date
2020-09
Publisher
WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Citation
Advanced Materials, Vol.32 No.38
Abstract
The legends and captions for Figure S8b,c in the Supporting Information of the originally published article were found to be switched with each other. The corrected Figure S8 is shown below. 8 Figure (Figure presented.) a–c) The time evolution of transfer curves for the doped/unetched PBTTT transistor with channel length Lch, of 50 µm (a); the doped/unetched PBTTT transistor with Lch = 100 µm (b), the doped contact (doped/etched) PBTTT transistor with Lch = 50 µm (c), and the doped contact PBTTT transistor with Lch = 100 µm (d) over two months. © 2020 Wiley-VCH GmbH
ISSN
0935-9648
URI
https://hdl.handle.net/10371/202531
DOI
https://doi.org/10.1002/adma.202003126
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  • College of Engineering
  • Department of Materials Science & Engineering
Research Area Molecular doping in emerging semiconductors, Next-generation electronic devices, Transport phenomena in organic semiconductors

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