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Stacking-Order Dependence of Strain in Bilayer Graphene: Implications for High-Performance Electronics : Stacking-Order Dependence of Strain in Bilayer Graphene:Implications for Higrh- Performance Eletronics

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Authors

Sim, Jaegun; Yoon, Jooyoung; Lee, Yejun; Lee, Ha Eun; Jang, Ho Won; Hong, Byung Hee

Issue Date
2024-05
Publisher
American Chemical Society
Citation
ACS Applied Nano Materials, Vol.7 No.9, pp.9893-9897
Abstract
The Cu step bunches formed during the synthesis of graphene by chemical vapor deposition (CVD) have been intensively studied to optimize the electrical and mechanical properties of graphene. For example, it has been reported that the compressive strain due to the mismatch between the thermal expansion coefficients of Cu and graphene tends to be released by forming periodic steps depending on the number of graphene layers. However, the stacking-order dependence of the step bunches in multilayer graphene has not yet been investigated. Here, we show that the twisted bilayer graphene (tBLG) with less compressive strain induces the formation of considerably smaller step bunches compared to the case of AB-stacked bilayer graphene (BLG), as evidenced by atomic force microscopy (AFM) and Raman spectroscopy. It is supposed that interlayer slipping between the weakly coupled tBLG layers weakens mechanical stiffness as well as compressive strain to deform the Cu surface. In addition, we also find that the direction of Cu step bunches depends on the lattice orientation of tBLG. Thus, our findings are expected to provide insights into understanding and improving the electrical and mechanical properties of multilayer CVD graphene for high-performance device applications.
ISSN
2574-0970
URI
https://hdl.handle.net/10371/203340
DOI
https://doi.org/10.1021/acsanm.4c01088
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  • College of Natural Sciences
  • Department of Chemistry
Research Area Physics

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