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Transport through single dopants in gate-all-around silicon nanowire MOSFETs (SNWFETs)
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hong, Byung Hee | - |
dc.contributor.author | Jung, Young Chai | - |
dc.contributor.author | Hwang, Sung Woo | - |
dc.contributor.author | Cho, Keun Hwi | - |
dc.contributor.author | Yeo, Kyoung Hawn | - |
dc.contributor.author | Yeoh, Yun Young | - |
dc.contributor.author | Suk, Sung Dae | - |
dc.contributor.author | Li, Ming | - |
dc.contributor.author | Kim, Dong W. | - |
dc.contributor.author | Park, Dong Gun | - |
dc.contributor.author | Oh, Kyung Seok | - |
dc.contributor.author | Lee, Won Seong | - |
dc.date.accessioned | 2024-07-12T01:59:04Z | - |
dc.date.available | 2024-07-12T01:59:04Z | - |
dc.date.created | 2024-06-19 | - |
dc.date.issued | 2008-06 | - |
dc.identifier.citation | IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008, pp.51-+ | - |
dc.identifier.uri | https://hdl.handle.net/10371/204664 | - |
dc.description.abstract | Temperature (T) dependent transport measurements of cylindrical shaped gate-all-around silicon nanowire MOSFETs (SNWFETs) were performed. Single electron tunneling behaviors were observed at 4.2 K and one of the devices exhibited anomalously strong current peak which survived even at room temperature. The observed peak was interpreted as an evidence of transport through single impurities in the channel. | - |
dc.language | 영어 | - |
dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
dc.title | Transport through single dopants in gate-all-around silicon nanowire MOSFETs (SNWFETs) | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/SNW.2008.5418464 | - |
dc.citation.journaltitle | IEEE 2008 Silicon Nanoelectronics Workshop, SNW 2008 | - |
dc.identifier.wosid | 000279102800027 | - |
dc.identifier.scopusid | 2-s2.0-77949982219 | - |
dc.citation.endpage | + | - |
dc.citation.startpage | 51 | - |
dc.description.isOpenAccess | N | - |
dc.contributor.affiliatedAuthor | Hong, Byung Hee | - |
dc.type.docType | Conference Paper | - |
dc.description.journalClass | 1 | - |
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