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Full-Field Subwavelength Imaging Using a Scattering Superlens
Cited 77 time in
Web of Science
Cited 93 time in Scopus
- Authors
- Issue Date
- 2014-09
- Publisher
- American Physical Society
- Citation
- Physical Review Letters, Vol.113 No.11, p. 113901
- Abstract
- Light-matter interaction gives optical microscopes tremendous versatility compared with other imaging methods such as electron microscopes, scanning probe microscopes, or x-ray scattering where there are various limitations on sample preparation and where the methods are inapplicable to bioimaging with live cells. However, this comes at the expense of a limited resolution due to the diffraction limit. Here, we demonstrate a novel method utilizing elastic scattering from disordered nanoparticles to achieve subdiffraction limited imaging. The measured far-field speckle fields can be used to reconstruct the subwavelength details of the target by time reversal, which allows full-field dynamic super-resolution imaging. The fabrication of the scattering superlens is extremely simple and the method has no restrictions on the wavelength of light that is used.
- ISSN
- 0031-9007
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