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Full-Field Subwavelength Imaging Using a Scattering Superlens

Cited 77 time in Web of Science Cited 93 time in Scopus
Authors

Park, Chunghyun; Park, Jung-Hoon; Rodriguez, Christophe; Yu, HyeonSeung; Kim, Minkwan; Jin, Kyoungsuk; Han, Seungyong; Shin, Jonghwa; Ko, Seung Hwan; Nam, Ki Tae; Lee, Yong-Hee; Cho, Yong-Hoon; Park, YongKeun

Issue Date
2014-09
Publisher
American Physical Society
Citation
Physical Review Letters, Vol.113 No.11, p. 113901
Abstract
Light-matter interaction gives optical microscopes tremendous versatility compared with other imaging methods such as electron microscopes, scanning probe microscopes, or x-ray scattering where there are various limitations on sample preparation and where the methods are inapplicable to bioimaging with live cells. However, this comes at the expense of a limited resolution due to the diffraction limit. Here, we demonstrate a novel method utilizing elastic scattering from disordered nanoparticles to achieve subdiffraction limited imaging. The measured far-field speckle fields can be used to reconstruct the subwavelength details of the target by time reversal, which allows full-field dynamic super-resolution imaging. The fabrication of the scattering superlens is extremely simple and the method has no restrictions on the wavelength of light that is used.
ISSN
0031-9007
URI
https://hdl.handle.net/10371/207361
DOI
https://doi.org/10.1103/PhysRevLett.113.113901
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Research Area Laser Assisted Patterning, Liquid Crystal Elastomer, Stretchable Electronics, 로보틱스, 스마트 제조, 열공학

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