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Imaging of 2-dimensional dislocation networks in twisted bilayer graphene and beyond

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Authors

Engelke, Rebecca; Yoo, Hyobin; Carr, Stephen; Sung, Suk Hyun; Zhang, Kuan; Valdivia, Andres Mier; Tadmor, Ellad; Hovden, Robert; Kaxiras, Efthimos; Kim, Philip

Issue Date
2020-08
Publisher
Cambridge University Press
Citation
Microscopy and Microanalysis, Vol.26 No.S2, pp.854-855
ISSN
1431-9276
URI
https://hdl.handle.net/10371/217876
DOI
https://doi.org/10.1017/S1431927620016086
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Yoo, Hyobin유효빈
조교수
  • College of Engineering
  • Department of Materials Science & Engineering
Research Area Atomic Scale Electron Microscopy, Designer Interface & Atomic Scale Engineering, Operando Electron Microscopy
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