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Issue DateTitle / Author(s) / CitationFileAltmetrics
2020-08
Single-Layer Edge Detecting Metalens with Combining Lens and Spiral Phase Profiles

Kim, Young Jin; Kim, Changhyun; Lee, Byoungho

2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR), p. 9256976

DOI
1