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Issue Date | Title / Author(s) / Citation | File | Altmetrics |
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2016-04 | IEEE Transactions on Electron Devices, Vol.63 No.4, pp.1533-1538 | DOI | |
2019-03 | 2019 20TH INTERNATIONAL CONFERENCE ON THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS (EUROSIME), p. 8724510 | DOI |
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