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Showing results 1 to 2 of 2

Issue DateTitle / Author(s) / CitationFileAltmetrics
2010-11

Yan, Long; Yoo, Jerald; Kim, Binhee; Yoo, Hoi-Jun

IEEE Journal of Solid-State Circuits, Vol.45 No.11, pp.2356-2365

DOI
2020

Yoo, Jerald

2020 17TH INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC 2020), pp.207-208

DOI
1