Elnaggar, Ahmed; Heinzinger, Michael; Dallago, Christian; Rehawi, Ghalia; Yu, Wang; Jones, Llion; Gibbs, Tom; Feher, Tamas; Angerer, Christoph; Steinegger, Martin; Bhowmik, Debsindhu; Rost, Burkhard
IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol.44 No.10, pp.7112-7127