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Issue DateTitle / Author(s) / CitationFileAltmetrics
2015-04DOI
2015-12

Choi, Taejun; Kim, Sang Jin; Park, Subeom; Hwang, Taekyong; Jeon, Youngro; Hong, Byung Hee

Technical Digest - International Electron Devices Meeting, IEDM, pp.27.7.1-27.7.4

DOI
1