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Issue DateTitle / Author(s) / CitationFileAltmetrics
2010-07DOI
2012-06

Ihm, Kyu Wook; Lee, Kyung Jae; Lim, Jong Tae; Kang, Tai Hee; Chung, Suk Min; Hong, Byung Hee; Yeom, Geun Young

Surface and Interface Analysis, Vol.44 No.6, pp.744-748

DOI
1