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A study on the improved characteristics of polycrystalline silicon thin film transistors

DC Field Value Language
dc.contributor.advisor한민구-
dc.contributor.author박철민-
dc.date.accessioned2010-01-15T04:23:07Z-
dc.date.available2010-01-15T04:23:07Z-
dc.date.copyright1999.-
dc.date.issued1999-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000074318eng
dc.identifier.urihttp://hdl.handle.net/10371/30920-
dc.descriptionThesis (doctoral)--서울대학교 대학원 :전기공학부,1999.en
dc.format.extentxvii, 194 p.en
dc.language.isoenen
dc.publisher서울대학교 대학원en
dc.titleA study on the improved characteristics of polycrystalline silicon thin film transistorsen
dc.typeThesis-
dc.contributor.department전기공학부-
dc.description.degreeDoctoren
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College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Theses (Ph.D. / Sc.D._전기·정보공학부)
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