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College of Engineering/Engineering Practice School (공과대학/대학원)
Dept. of Electrical and Computer Engineering (전기·정보공학부)
Theses (Master's Degree_전기·정보공학부)
전기적으로 유도된 터널 장벽을 가지는 단전자 트랜지스터의 특성에 관한 연구
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 박병국 | - |
| dc.contributor.author | 김경록 | - |
| dc.date.accessioned | 2010-01-15T04:32:48Z | - |
| dc.date.available | 2010-01-15T04:32:48Z | - |
| dc.date.copyright | 2001. | - |
| dc.date.issued | 2001 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000065384 | kor |
| dc.identifier.uri | https://hdl.handle.net/10371/31034 | - |
| dc.description | 학위논문(석사)--서울대학교 대학원 :전기.컴퓨터공학부,2001. | ko |
| dc.format.extent | ii, 53 장 | ko |
| dc.language.iso | ko | ko |
| dc.publisher | 서울대학교 대학원 | ko |
| dc.subject | 단전자 트랜지스터 | ko |
| dc.subject | Silicon On Insulator | ko |
| dc.subject | 이중 게이트(side gate) | ko |
| dc.subject | 전류 진동 | ko |
| dc.subject | 쿨룸 갭(coulomb gap) | ko |
| dc.subject | e-beam irregularity | ko |
| dc.subject | sidewall lithography | ko |
| dc.subject | Single electron transistor | ko |
| dc.subject | SOI(Silicon On Insulator) | ko |
| dc.subject | side-gate oscillation period | ko |
| dc.subject | Coulomb gap | ko |
| dc.subject | the irregularity of e-beam lithography | ko |
| dc.subject | sidewall lithography | ko |
| dc.title | 전기적으로 유도된 터널 장벽을 가지는 단전자 트랜지스터의 특성에 관한 연구 | ko |
| dc.type | Thesis | - |
| dc.contributor.department | 전기.컴퓨터공학부 | - |
| dc.description.degree | Master | ko |
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- College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Theses (Master's Degree_전기·정보공학부)
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