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SiN passivation 이 HEMT 소자에 미치는 영향에 대한 연구

DC Field Value Language
dc.contributor.advisor서광석-
dc.contributor.author고대영-
dc.date.accessioned2010-01-18T08:30:08Z-
dc.date.available2010-01-18T08:30:08Z-
dc.date.copyright2002.-
dc.date.issued2002-
dc.identifier.urihttp://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000061255kor
dc.identifier.urihttp://hdl.handle.net/10371/36988-
dc.description학위논문(석사)--서울대학교 대학원 :전기·컴퓨터공학부,2002.ko
dc.format.extent46 장ko
dc.language.isokoko
dc.publisher서울대학교 대학원ko
dc.titleSiN passivation 이 HEMT 소자에 미치는 영향에 대한 연구ko
dc.typeThesis-
dc.contributor.department전기·컴퓨터공학부-
dc.description.degreeMasterko
Appears in Collections:
College of Engineering/Engineering Practice School (공과대학/대학원)Dept. of Electrical and Computer Engineering (전기·정보공학부)Theses (Master's Degree_전기·정보공학부)
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