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서브 픽셀 알고리즘을 이용한 TFT-LCD 노광 공정에서의 이물 검출 방법 개발
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- Authors
- Advisor
- 박희재
- Issue Date
- 2006
- Publisher
- 서울대학교 대학원
- Keywords
- 이물 ; Particle ; 서브 픽셀 ; Sub-pixel ; Adaptive Thresholding ; Adaptive Thresholding ; 가우시안 모델링 ; Gaussian Modeling
- Description
- 학위논문(석사)--서울대학교 대학원 :기계항공공학부,2006.
- Language
- Korean
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047570
https://hdl.handle.net/10371/43769
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