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Fast defect detection and classification of patterned thin film transistor-liquid crystal displays
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 박희재 | - |
| dc.contributor.author | 강성범 | - |
| dc.date.accessioned | 2010-01-26T03:52:04Z | - |
| dc.date.available | 2010-01-26T03:52:04Z | - |
| dc.date.copyright | 2006. | - |
| dc.date.issued | 2006 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000047535 | eng |
| dc.identifier.uri | https://hdl.handle.net/10371/44469 | - |
| dc.description | Thesis(master`s)--서울대학교 대학원 :기계항공공학부,2006. | en |
| dc.format.extent | ix, 38 leaves | en |
| dc.language.iso | en | en |
| dc.publisher | 서울대학교 대학원 | en |
| dc.subject | LCD | en |
| dc.subject | LCD | en |
| dc.subject | 결함 검사 | en |
| dc.subject | Defect Inspection | en |
| dc.subject | 영역 결합 | en |
| dc.subject | Region Merging | en |
| dc.subject | 경계 확장 | en |
| dc.subject | Border Expansion | en |
| dc.subject | 결함 분류 | en |
| dc.subject | Defect Classification | en |
| dc.title | Fast defect detection and classification of patterned thin film transistor-liquid crystal displays | en |
| dc.type | Thesis | - |
| dc.contributor.department | 기계항공공학부 | - |
| dc.description.degree | Master | en |
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