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Study on random telegraph noise in nano scale MOSFET : Nano scale MOSFET의 RTN 연구
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | 이종덕 | - |
| dc.contributor.author | 양승원 | - |
| dc.date.accessioned | 2010-01-26T06:15:42Z | - |
| dc.date.available | 2010-01-26T06:15:42Z | - |
| dc.date.copyright | 2009. | - |
| dc.date.issued | 2009 | - |
| dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000037047 | eng |
| dc.identifier.uri | https://hdl.handle.net/10371/44755 | - |
| dc.description | Thesis(masters) --서울대학교 대학원 :전기. 컴퓨터공학부, 2009.2. | en |
| dc.format.extent | iv, 70 leaves | en |
| dc.language.iso | en | en |
| dc.publisher | 서울대학교 대학원 | en |
| dc.subject | 나노와이어 소자 | en |
| dc.subject | Random Telegraph Noise | en |
| dc.subject | RTN | en |
| dc.subject | RTN | en |
| dc.subject | 트랩의 위치 | en |
| dc.subject | CMOS Image Sensor | en |
| dc.subject | 산화막 트랩 | en |
| dc.subject | Oxide trap | en |
| dc.subject | Nanowire MOSFETs | en |
| dc.subject | Location of trap | en |
| dc.title | Study on random telegraph noise in nano scale MOSFET | en |
| dc.title.alternative | Nano scale MOSFET의 RTN 연구 | en |
| dc.type | Thesis | - |
| dc.contributor.department | 전기. 컴퓨터공학부 | - |
| dc.description.degree | Master | en |
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