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Temporal noise analysis and reduction method in CMOS image sensor readout circuit : CMOS image sensor readout 회로의 temporal 잡음 분석과 감소 방법
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | 신형철 | - |
dc.contributor.author | 김봉찬 | - |
dc.date.accessioned | 2010-01-26T09:56:34Z | - |
dc.date.available | 2010-01-26T09:56:34Z | - |
dc.date.copyright | 2009. | - |
dc.date.issued | 2009 | - |
dc.identifier.uri | http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000037008 | eng |
dc.identifier.uri | https://hdl.handle.net/10371/44879 | - |
dc.description | Thesis(masters) --서울대학교 대학원 :전기. 컴퓨터공학부, 2009.2. | en |
dc.format.extent | iv, 42 leaves | en |
dc.language.iso | en | en |
dc.publisher | 서울대학교 대학원 | en |
dc.subject | CMOS image sensor readout 회로 | en |
dc.subject | CMOS image sensor readout circuit | en |
dc.subject | Correlated double sampling | en |
dc.subject | Correlated double sampling | en |
dc.subject | 저주파 잡음 (1/f 잡음과 RTN) | en |
dc.subject | Low frequency noise(1/f noise and RTN) | en |
dc.subject | 잡음 감소 | en |
dc.subject | Noise reduction | en |
dc.subject | 잡음 전달 함수 | en |
dc.subject | Noise transfer function | en |
dc.subject | 열 잡음 | en |
dc.subject | Thermal noise | en |
dc.title | Temporal noise analysis and reduction method in CMOS image sensor readout circuit | en |
dc.title.alternative | CMOS image sensor readout 회로의 temporal 잡음 분석과 감소 방법 | en |
dc.type | Thesis | - |
dc.contributor.department | 전기. 컴퓨터공학부 | - |
dc.description.degree | Master | en |
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