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Wafer macro 불량 알고리즘의 개발
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- Authors
- Advisor
- 유석인
- Issue Date
- 2008
- Publisher
- 서울대학교 대학원
- Keywords
- 반도체 ; Die ; 불량 ; Defect ; Alignment ; Alignment ; Inspection ; Inspection ; Wafer ; Wafer ; 비전 ; Vision
- Description
- 학위논문(석사) --서울대학교 대학원 :전기. 컴퓨터공학부,2008.2.
- Language
- Korean
- URI
- http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000041324
https://hdl.handle.net/10371/45095
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