Modeling of semiconductor device noise using the impedance field method

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Modeling of semiconductor device noise using the impedance field method : Impedance field method를 이용한 반도체 소자 잡음 모델링

DC Field	Value	Language
dc.contributor.advisor	박영준	-
dc.contributor.author	나현철	-
dc.date.accessioned	2010-01-27T23:15:31Z	-
dc.date.available	2010-01-27T23:15:31Z	-
dc.date.copyright	2003.	-
dc.date.issued	2003	-
dc.identifier.uri	http://dcollection.snu.ac.kr:80/jsp/common/DcLoOrgPer.jsp?sItemId=000000059540	eng
dc.identifier.uri	https://hdl.handle.net/10371/45872	-
dc.description	Thesis (doctoral)--서울대학교 대학원 :전기·컴퓨터공학부,2003.	en
dc.format.extent	viii, 101 leaves	en
dc.language.iso	en	en
dc.publisher	서울대학교 대학원	en
dc.subject	잡음	en
dc.subject	Noise	en
dc.subject	flicker	en
dc.subject	Flicker	en
dc.subject	1/f	en
dc.subject	$1/f$	en
dc.subject	impedance field method	en
dc.subject	Impedance field method	en
dc.subject	잡음 계산	en
dc.subject	Noise calculation	en
dc.subject	MOSFET	en
dc.subject	Mosfet	en
dc.subject	반도체 소자	en
dc.subject	Semiconductor devices	en
dc.subject	characteristic potential method	en
dc.subject	Characteristic potential method	en
dc.title	Modeling of semiconductor device noise using the impedance field method	en
dc.title.alternative	Impedance field method를 이용한 반도체 소자 잡음 모델링	en
dc.type	Thesis	-
dc.contributor.department	전기·컴퓨터공학부	-
dc.description.degree	Doctor	en

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